Optical chip reliability testing system

product feature

The system has 11 layers, each layer has four aging drawers. Each drawer supports single or dual carriers.

CARRIER can be compatible with test machine, loading and unloading machine, patch and wire machine (specific size can be customized).

Precision fixture and probe plate design, crimping success rate 100%.

Changing the probe board and CARRIER can meet the aging requirements of different COC products.

High precision and stable current and voltage drive source.

Excellent EOS and ESD protection to ensure 100% product safety.

Independent drawer temperature control, stable and reliable temperature, each aging unit can be independent

Operation, so that customers more efficient and convenient operation.

Online optical power monitoring, support LIV scanning, junction temperature testing, wavelength testing, etc.

Real-time monitoring of current, voltage, ambient temperature, COC temperature and light during aging

Power and other parameters.

Safe and intelligent software system, support power automatic connection, : pause continue and other operations

, support online and offline browsing data.

system specs

Overall production capacity

Carrier joni

System temperature zone

The whole machine is heavy

Overall size

4224(Single drawer dual Carrier mode)

48

Drawer independent temperature control

1000Kg

1000mm (w)*1200mm (D)*2 1 50mm (H)

Drive specification

Constant current setting range

Current setting accuracy

Current setting resolution

Current output stability

Constant pressure setting range

Voltage setting accuracy

Voltage setting resolution

Voltage output stability

0~500mA

0.5%ofF.S.± 50uA

50uA

1% @200h

-7.5~7.5V

0.5% of F.S±10mv

1mV

1% @200h

Temperature specification

Temperature control mode

Temperature control range

Temperature accuracy

Temperature stability

Rising/cooling rate

C0C thermistor monitoring

Sheet heating sheet

45 ~ 150 ℃

+ 0.5 ℃

+ / - 1 ℃

5'℃/min

Support thermistor online monitoring, monitoring

Temperature and measured temperature <0.5℃

LIV Scanning & Optical Power online monitoring

Monitoring mode

Optical power stability

Po stability

Ith stability

Current resolution

Relative optical power monitoring

≤1% @200h

≤1%

≤1%

0.5mA