SiC chip level testing

Handler and test machine separate design, flexible configuration, strong scalability.
Support customized configuration of multiple loading and unloading methods: blue film, Gel-pak, Waffle
Pack and Tape&Reel.
Support static parameter and dynamic parameter test, can also be increased or decreased according to customer needs.
Support duplex station and quadruplex station configuration, each station can independently configure the test conditions and
Test the project.
Support 2000V/200A static test, 2000V/1000A dynamic test.
Temperature control range: room temperature ~ 200℃, accuracy <0.5℃, resolution 0.1℃.
Professional probe design, controllable needle marks, stable and reliable test accuracy.
Pin card seal design, support nitrogen protection and nitrogen pressure monitoring.
Supports the Bin function. You can directly generate Bin Map files or place partitions.
Test data supports local data storage and client MES connection upload.
Recipe editing is simple and flexible, and online editing test Recipe is supported.
The software has three-level permission management and multi-account login management functions.