ATE Test System

TO Automation Test System

Product description: TO automatic testing machine series, suitable for DFB, EML, FP, VCSEL chips in TO packaging such as TO46, TO56
INQUIRY

Product introduction:

1. Support LIV scanning, PD monitoring, EA scanning, spectrum test.
2. Keithley standard source meter, high power/sampling accuracy and fast speed.
3. TEC+ water cooling temperature control, maximum support -40~150C temperature control test.
4. Specially designed vehicles to support customer customized requirements for feeding methods.
5. Extensible and compatible with COB and PCB board testing.

Specifications:

Test category	Test item
LIV	LIV Curve
	Voltage @ Set Iop
	Power @ Set Iop
	Threshold Current (Ith)
	Series Resistance (Rs)
	Slope Efficiency (SE)
	Leak Current
	Power Conversion Efficiency (PCE)
	Kink
	Spectrum Width (FWHM & RMS)
EA	EA Curve
	OMA Curve
	ER Curve
	Von Best
Spectrum	Peak Wavelength
	RMS
	SMSR
Parameters can be added according to customer needs