ATE Test System

VCSEL Automation Test System

Product description: VCSEL automated testing machine series (Wafer Level & Die Level), suitable for i-TOF&d-TOF&speckle VCSEL Array, Single Eimtter VCSEL
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Product introduction:

1. Support LIV+ spectrum test, CW, QCW conditions can be freely configured.
2. Support Near Filed test, including Uniformity, Beam Waist, M2, divergence angle test.
3. Support Far Field test, including Eyesafty and DIP test.
4. Use TEC + water cooling method for temperature control, with high temperature stability and large controllable range.
5. Modular design, three test functions can be arbitrarily selected.

Specifications:

Test category	Test item
LIV	LIV Curve
	Voltage @ Iop
	Power @ Iop
	Threshold Current (Ith)
	Series Resistance (Rs)
	Slope Efficiency (SE)
	Leak Current (or VRB)
	Power Conversion Efficiency (PCE)
	Center Wavelength (λc)
	Spectrum Width (FWHM & RMS)
NF	Uniformity
	M2
	Divergent Angle
	Beam Waist
FF	Divergence Angle
	Max power through 7mm aperture
	DIP
Parameters can be added according to customer needs