ATE Test System

Chip Automation Test System

Product description: Chi automatic testing machine series, suitable for DFB, EML, FP and other EEL chips
INQUIRY

Product introduction:

1. Support LIV scanning, backlight monitoring, EA scanning, spectrum test.
2. Keithley standard source meter, high power/sampling accuracy and fast speed.
3. TEC+ water cooling temperature control, maximum support -40~150C temperature control test.
4. The design of dual motion mechanism and stage can realize dual temperature test.
4. Fully automated testing. After the test is completed, Bin will be placed in different blanking areas.
5. Automatic positioning recognition, three-dimensional adjustment, no friction between the chip and the carrier, increasing the service life of the carrier.

Specifications:

Test category	Test item
LIV	LIV Curve
	Voltage @ Set Iop
	Power @ Set Iop
	Threshold Current (Ith)
	Series Resistance (Rs)
	Slope Efficiency (SE)
	Leak Current
	Power Conversion Efficiency (PCE)
	Kink
	Spectrum Width (FWHM & RMS)
EA	EA Curve
	OMA Curve
	ER Curve
	Von Best
Spectrum	Peak Wavelength
	RMS
	SMSR
Parameters can be added according to customer needs